Friday, 20 April 2018

Atomic force microscopy (AFM): Graphene-Based Electronics


A straightforward method to adjust atoms in a single bearing on a level graphene surface and effectively controlling sub-atomic arrangement is depend upon to prompt real advance in surface science and sub-atomic designing and above all in the field of materials science.

Graphene is a type of material that is attracting many scientists, students and researchers as a powerful candidate for next generation of electronics materials and in the field of material science due to their unique properties. The graphene surface has three-overlay symmetry, which are thermodynamically equal to each other and along these lines making it hard to adjust the atoms in an arranged or special course.

Atomic force microscopy (AFM) is a type of technique mainly used for detecting surfaces additionally to control sub-atomic arrangement and produces pictures demonstrating the surface uneven layer of precious stone by sliding a test tip over the surface region.


The grey plane represents the graphene surface. The stick-like particles consisting of white, grey, red, yellow white colored balls represent surfactant (sodium dodecyl sulphate (SDS)) molecules. The grey colored reverse pyramid-like structure shows the probe tip of AFM.

At that point the examination on AFM, it demonstrates how AFM tip filtering prompts changes in atomic arrangement on the graphene surface of any material or precious stone. They utilized sodium dodecyl sulphate (SDS), a typical surfactant atom, as a model particle and it forms like ribbon on the graphene surface. It has been observed that SDS strips developed effectively when the relative edge between the ribbon developing hub and the sweep bearing is bigger and adsorbed SDS atoms are really evacuated when they are compelled to pivot under the AFM filtering conditions. This method shows that the AFM scan can help in the 'symmetry breaking' effect of the molecular pattern on graphene.


The idea of breaking the surface symmetry can be used for different purposes, for example, producing sub-atomic circuits in sub-atomic hardware science as well as in related fields that include sub-atomic nanostructures and their arrangement.

Meet us at “4th International Conference on Crystallography & Novel Materials” in Bucharest, Romania for more recent updates on Material Science and Crystallography.


1 comment:

  1. Very excellent information, thank you for posting such a nice blog.
    For more information visit here: Atomic Force Microscope

    ReplyDelete